Announcement of Bid Evaluation Results for Focused Ion Beam-Scanning Electron Dual-Beam Microscope

This announcement presents the results of the bid evaluation for a Focused Ion Beam-Scanning Electron Dual-Beam Microscope. The tender, identified by reference number 0705-264506026021, pertains to the computer, communication, and other electronic equipment manufacturing industry. The procurement took place in Shanghai, China, with funding from spot exchange. This advanced microscopy equipment combines focused ion beam (FIB) and scanning electron microscopy (SEM) capabilities, offering high-resolution imaging and precise material analysis and manipulation. Such instruments are vital for research and development in nanotechnology, materials science, semiconductor analysis, and failure analysis. The public announcement of the bid evaluation results signifies the completion of a transparent procurement process for this sophisticated scientific instrument. Acquiring this dual-beam microscope will significantly enhance the analytical and research capabilities of the procuring entity, likely a research institution or a high-tech company.

This is a supplies contract in the information and communication technology sector. Located in China, Asia, this opportunity is open to firms and consortiums.

Published through ChinaBidding, a national government procurement portal. Public procurement tenders follow the country's national bidding regulations and may have specific eligibility and documentation requirements for the supply of goods in the information and communication technology sector. Supply contracts typically require bidders to demonstrate product compliance with technical specifications, delivery capacity, and relevant certifications. This contract has already been awarded. The information is published for transparency and market intelligence purposes.