Scanning Force Microscope with Phase-Resolved Detection of Scattered Near-Field Optical Signal

The Friedrich Schiller University Jena is seeking to procure a Scanning Force Microscope (SFM) equipped with phase-resolved detection of the scattered near-field optical signal, also known as scattering Scanning Nearfield Optical Microscope (s-SNOM). This advanced instrument is intended for the characterization of excitation dynamics on nanostructured surfaces. The microscope will operate under excitation with coherent laser radiation across the visible to infrared spectral range. A key requirement is the achievement of a lateral spatial resolution of 30 nm, which will be accomplished through intensity- and phase-resolved measurement of the optical near-field scattered from a probe tip. The technical performance parameters outlined in Appendix 2 of the tender documents must be met or exceeded. This procurement represents a significant investment in cutting-edge microscopy technology, enabling detailed investigation of nanoscale optical phenomena and material properties. The s-SNOM system is expected to facilitate breakthroughs in surface science, materials research, and nanotechnology by providing unprecedented resolution and sensitivity in optical measurements at the nanoscale.

This is a supplies contract in the Research sector, with a focus on R&D equipment. Located in Germany, Europe, this opportunity is open to firms and consortiums.

Published through TED - Tenders Electronic Daily (EU), a national government procurement portal. Public procurement tenders follow the country's national bidding regulations and may have specific eligibility and documentation requirements for the supply of goods in the Research sector. Supply contracts typically require bidders to demonstrate product compliance with technical specifications, delivery capacity, and relevant certifications. This contract has already been awarded. The information is published for transparency and market intelligence purposes.